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BS PD IEC TS 62607-6-3:2020

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Nanomanufacturing. Key control characteristics
standard by BSI Group, 11/02/2020

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Description

This part of IEC TS 62607 establishes a standardized method to determine the structural keycontrol characteristic

– domain size
for films consisting of graphene grown by chemical vapour deposition (CVD) on copper by
– substrate oxidation.

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:
11/02/2020
ISBN(s):
9780580973338
Number of Pages:
26
File Size:
1 file , 5.5 MB
Product Code(s):
30355585, 30355585, 30355585